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Description
Eliminates surface damage caused by the high-energy ion beam. Measures the real crystal structure instead of artifacts on TEM or SEM samples, with Technoorg's unique endpolisher.
Low-energy ion mill for endpolishing
The Gentle Mill series ion polishers are partly or fully computer controlled systems for high-quality final polishing and cleaning of TEM, XTEM, HRTEM, STEM and FIB samples and surface cleaning of SEM samples of best quality. The latest model of Gentle Mill, is a fully automated machine allowing an easy-to-use, operator-independent, fast sample preparation procedure.
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Gentle Mill
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